VT&C Vacuum Components and Systems Catalog & Literature
The VASE is an accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range – up to 193 to 4000nm. Variable wavelength and angle of incidence allow flexible measurement capabilities.
J.A. Woollam Co., Inc.
Lincoln, NE
http://www.jawoollam.com/
Tel: 1-402-477-7501
Email: sales@jawoollam.com
The alpha-SE spectroscopic ellipsometer is perfect for routine measurements of thin film thickness and refractive index. Simply mount your sample, choose a model that describes your film, and press “measure”. You have results within seconds. The alpha-SE is perfect for thin layers with thickness ranging from a nanometer to a few microns. The alpha-SE is easy-to-use, works with many materials (dielectrics, semiconductors, organics, and more), is fast, and yet is affordable.
J.A. Woollam Co., Inc.
Lincoln, NE
http://www.jawoollam.com/
Tel: 1-402-477-7501
Email: sales@jawoollam.com
The next generation of ellipsometry software has arrived with CompleteEASE, our revolutionary new software for Woollam ellipsometers. It’s easier than ever to use, and with the world-class quality you’ve come to expect from Woollam Company. CompleteEASE is an all-inclusive software package to handle all your ellipsometry requirements. Conveniently measure the uniformity of your samples with automated sample mapping. Collect in-situ data with spectroscopic ellipsometry on your process chamber or with add-on temperature control stage or liquid cell. All your data acquisition needs are combined into one easy-to-use software package.
J.A. Woollam Co., Inc.
Lincoln, NE
http://www.jawoollam.com/
Tel: 1-402-477-7501
Email: sales@jawoollam.com
The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition combine in an extremely powerful and versatile tool. The M-2000 delivers both speed and accuracy. Our patented RCE technology combines Rotating Compensator Ellipsometry with high-speed CCD detection to collect the entire spectrum (hundreds of wavelengths) in a fraction of a second with a wide array of configurations. The M-2000 is the first ellipsometer to truly excel at everything from in-situ monitoring and process control to large-area uniformity mapping and general-purpose thin film characterization. No other ellipsometer technology acquires a full spectrum faster.
J.A. Woollam Co., Inc.
Lincoln, NE
http://www.jawoollam.com/
Tel: 1-402-477-7501
Email: sales@jawoollam.com
The RC2 spectroscopic ellipsometers from the J.A. Woollam Company build on 25 years of experience. They combine the best features of previous models with innovative new technology: dual rotating compensators, achromatic compensator design, advanced light source and next-generation spectrometer design. The RC2 is a near-universal solution for the diverse applications of spectroscopic ellipsometry.
J.A. Woollam Co., Inc.
Lincoln, NE
http://www.jawoollam.com/
Tel: 1-402-477-7501
Email: sales@jawoollam.com
The IR-VASE is the first and only spectroscopic ellipsometer to combine the chemical sensitivity of FTIR spectroscopy with thin film sensitivity of spectroscopic ellipsometry. The IR-VASE covers the wide spectral range from 1.7 to 30 microns (333 to 5900 wavenumbers). It is used to characterize both thin films and bulk materials in research and industry. This rapidly growing technology is finding uses in the optical coatings, semiconductor, biological and chemical industries, as well as research labs.
J.A. Woollam Co., Inc.
Lincoln, NE
http://www.jawoollam.com/
Tel: 1-402-477-7501
Email: sales@jawoollam.com
The iSE is a new in-situ spectroscopic ellipsometer developed for real-time monitoring of thin film processing. Using our proven technology, the iSE enables users to optimize optical properties of deposited films, control film growth with sub-angstrom sensitivity, and monitor growth kinetics.
J.A. Woollam Co., Inc.
Lincoln, NE
http://www.jawoollam.com/
Tel: 1-402-477-7501
Email: sales@jawoollam.com